NANOTECHNOLOGY LAB

carlos.monton@utsa.edu

(210) 458 6564

The University of Texas at San Antonio. 
1 Circle UTSA. 
San Antonio, TX 78249.
USA

©2016 by C. Monton Research Lab.

 

Kleberg Advanced Microscopy Center

UTSA houses the most important state-of-the-art instruments in electron microscopy and other advanced microscopy equipment. The Center propels the world-class research in nanotechnology, biology, chemistry and condensed matter.

ARM JEOL
- In situ capabilities: Electrical-optical, mechanics, hall effect sensor, Cryo, tomography
- Electron holography
- Lorentz microscopy
- Spatially resolved elemental analysis by X-ray emission spectroscopy
- Localized electronic structure measurements by electron energy-loss spectroscopy
ZEISS FIB-SEM CROSSBEAM
- TEM Lamella Preparation
- Cross-sectioning
- Tomography 
- 3D Analytics
- Nanopattering
STEM HITACHI S-5500
- STEM bright field and dark field detectors. 
- Field-emission gun with a 0.4 nm of spatial resolution operated at 30 kV. 
- Equipped with a solid-state Bruker detector for spatially resolved chemical analysis by X-ray emission spectroscopy
- YAG backscattered electron detector to perform topography of the sample
HITACHI SEM1510
- Scanning electron microscope variable pressure. 
- EDS solid state detector
PANALYTICAL EMPYREAN XRD
- Diffraction measurements on powders, liquid dispersions, thin films, nanomaterials, solid objects and 3-D objects
- X-ray scattering (SAXS/WAXS) under low-vacuum conditions
-Grazing-incidence angle SAXS (GISAXS)
- Micro X-ray diffraction (µXRD) for thin film analysis, computed tomography 
- Anton-Paar DHS 1100 domed heated stage for non-ambient analysis
 
RIGAKU ULTIMA IV XRD
- Parallel and focused beam
- Small-angle and thin films attachment
 
RAMAN SPECTROSCOPY
- Raman Spectrometer Horiba with two different lasers beam (red and blue wavelength)
 
AFM AND MFM
Scanning probe microscopy Veeco Innova and Multimode: tapping and contact modes, AFM , MFM , EFM , CAFM , EC- STM , and nanoindentation modules.